Experimental determination of differential scattering coefficients for nickel by means of linearly polarized x-ray radiation
Wählisch A., Wansleben M., Weser J., Stadelhoff C., Holfelder I., Kayser Y., Beckhoff B.Metrology, x-ray fluorescence, x-ray scattering, Rayleigh scattering, Compton scattering
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 60 |
| Issue | 3 |
| Page numbers / Article number | 035001 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2023-4-21 |
| ISSN | 0026-1394, 1681-7575 |
| DOI | 10.1088/1681-7575/acca87 |
| Language | English |