Quantitative Element‐Sensitive Analysis of Individual Nanoobjects

Wählisch A., Rehbein S., Seim C., Weimann T., Hahm K., Dai G., Weser J., Kayser Y., Lubeck J., Hönicke P., Unterumsberger R., Beckhoff B.

nanobeam X-ray fluorescence (XRF), nanometrology, nanostructure characterization, quantitative analysis

Document type Article
Journal title / Source Small
Page numbers / Article number 2204943
Publisher's name Wiley
Publisher's address (city only) Hoboken, NJ, United States
Publication date 2022-12-15
ISSN 1613-6810, 1613-6829
DOI 10.1002/smll.202204943
Web URL https://onlinelibrary.wiley.com/doi/full/10.1002/smll.202204943
Language English

Back to the list view