Quantitative Element‐Sensitive Analysis of Individual Nanoobjects
Wählisch A., Rehbein S., Seim C., Weimann T., Hahm K., Dai G., Weser J., Kayser Y., Lubeck J., Hönicke P., Unterumsberger R., Beckhoff B.nanobeam X-ray fluorescence (XRF), nanometrology, nanostructure characterization, quantitative analysis
| Document type | Article |
| Journal title / Source | Small |
| Page numbers / Article number | 2204943 |
| Publisher's name | Wiley |
| Publisher's address (city only) | Hoboken, NJ, United States |
| Publication date | 2022-12-15 |
| ISSN | 1613-6810, 1613-6829 |
| DOI | 10.1002/smll.202204943 |
| Web URL | https://onlinelibrary.wiley.com/doi/full/10.1002/smll.202204943 |
| Language | English |