A new compact soft x-ray spectrometer for resonant inelastic x-ray scattering studies at PETRA III

Viefhaus J., Nordgren J., Siewert F., Reininger R., Hage A., Agåker M., Hahn U., Peters H. B., Yin Z., Yandayan Tanfer

synchrotron optics; X-ray optics; metrology for synchrotron optics; slope measurement; NOM; multilayer; focusing mirrors

Document type Article
Journal title / Source Review of Scientific Instruments
Volume 86
Issue 9
Page numbers / Article number 093109
Publisher's name AIP Publishing
Publication date 2015-9
ISSN 0034-6748, 1089-7623
DOI 10.1063/1.4930968
Language English

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