Verification of an optical micro-CMM using the focus variation technique: Aspects of probing errors

Sun W, Claverley J. D., Claverley James
Keywords:

Metrology, Optical, Coordinate measuring machine (CMM)

Document type Article
Journal title / Source CIRP Annals Manufacturing Technology
Peer-reviewed article 1
Volume 64
Issue 2
Page numbers / Article number 511-514
Publisher's name ELSEVIER
Publisher's address (city only) Amsterdam
Publication date 2015-8-1
ISSN 0007-8506
DOI 10.1016/j.cirp.2015.04.089
Web URL http://www.sciencedirect.com/science/article/pii/S0007850615000979
Language English

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