Verification concepts in S-parameter measurements
Mubarak F., Zeier M., Hoffmann J., Ridler N.M., Salter M.J., Kuhlmann K.Verification, scattering parameter, vector network analyzer.
| Document type | Proceedings |
| Journal title / Source | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
| Peer-reviewed article | 1 |
| Volume | NA |
| Issue | NA |
| Page numbers / Article number | NA |
| Publisher's name | IEEE |
| Publisher's address (city only) | NA |
| Publication date | 2016-7-15 |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM.2016.7540508 |
| Web URL | http://ieeexplore.ieee.org/document/7540508/ |
| Language | English |