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Verification concepts in S-parameter measurements

Mubarak F., Zeier M., Hoffmann J., Ridler N.M., Salter M.J., Kuhlmann K.
Keywords:

Verification, scattering parameter, vector network analyzer.

Document type Proceedings
Journal title / Source 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Peer-reviewed article 1
Volume NA
Issue NA
Page numbers / Article number NA
Publisher's name IEEE
Publisher's address (city only) NA
Publication date 2016-7-15
ISSN 2160-0171
DOI 10.1109/CPEM.2016.7540508
Web URL http://ieeexplore.ieee.org/document/7540508/
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)