Metrology challenges for microfluidics
van Heeren H., Silverio V., Pecnik C., Batista E.Microfluidics, metrology, fabrication, testing
| Document type | Article |
| Journal title / Source | CMM Magazine |
| Volume | 15 |
| Issue | 2 |
| Page numbers / Article number | 20-25 |
| Publisher's name | MST Global Ltd |
| Publication date | 2022-4-13 |
| ISSN | 2634-9167 |
| Web URL | http://www.cmmmagazine.com/cmm-articles/metrology-challenges-for-microfluidics/ |
| Language | English |
| Persistent Identifier | ISSN 2634-9167 |