Influence of active electrode impurity on memristive characteristics of ECM devices
Valov I., Michieletti F., Chen S., Weber C., Ricciardi C., Ohno T.Resistive switching, memristive devices
| Document type | Article |
| Journal title / Source | Journal of Solid State Electrochemistry |
| Volume | 28 |
| Issue | 5 |
| Page numbers / Article number | 1735-1741 |
| Publisher's name | Springer Science and Business Media LLC |
| Publisher's address (city only) | Dordrecht, GX, Netherlands |
| Publication date | 2024-2 |
| ISSN | 1432-8488, 1433-0768 |
| DOI | 10.1007/s10008-024-05821-w |
| Language | English |