Using Electromagnetic Modeling to Evaluate Uncertainty in a Millimeter-wave Cross-guide Verification Standard

Huang H., Ridler N. M., Salter M. J.
Keywords:

Uncertainty, Traceability, Cross-guide, Transmission loss measurements, Verification standard, Electromagnetic modeling, Millimeter-wave measurements.

Document type Proceedings
Journal title / Source 83rd ARFTG Microwave Measurement Conference (ARFTG), 2014
Peer-reviewed article 1
Volume N/A
Issue N/A
Page numbers / Article number N/A
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only) New York, USA
Publication date 2014-6-6
Conference name 83rd ARFTG Microwave Measurement Conference (ARFTG)
Conference date 06-06-2014 to 06-06-2014
Conference place Tampa, Florida, USA
ISSN N/A
DOI 10.1109/ARFTG.2014.6899523
ISBN N/A
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6899523
Language English

Back to the list view