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Hong-Ou-Mandel interferometry on a biphoton beat note

Chen, Y. (School of Information Science and Engineering, Fudan University, Shanghai, China), Fink, M., Steinlechner, F., Torres, J.P. and Ursin, R.
Keywords:

quantum metrology, Hong-Ou-Mandel

Document typeArticle
Journal title / Sourcenpj Quantum Information
Volume5
Issue1
Publisher's nameSpringer Science and Business Media LLC
Publication date 2019-05-24
ISSN2056-6387
DOI10.1038/s41534-019-0161-z
LanguageEnglish

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