Uncertainty Evaluation of an Alternative Conducted Emission Test Method

Zhao D., Cakir S., Sen O.
Keywords:

Alternative test method, ATM, conducted emission

Document type Proceedings
Journal title / Source Proceeding of the 7th Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity and Technical Exhibition (APEMC 2016)
Peer-reviewed article 1
Volume 1
Issue 1
Page numbers / Article number WE-PM-I-TC02-6
Publisher's name APEMC
Publication date 2016
Conference name The 7th Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity and Technical Exhibition (APEMC 2016)
Conference date 18-05-2016 to 21-05-2016
Conference place Shenzhen, China
DOI 10.1109/APEMC.2016.7522905
ISBN 978-1-4673-9494-9
Web URL http://ieeexplore.ieee.org/document/7522905/?arnumber=7522905&tag=1
Language English

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