Traceable quantitative Raman spectrometry and x-ray fluorescence analysis as non-destructive methods for spatially resolved chemical characterization of Cu(In,Ga)Se2 absorber films

Zakel SZ, Pollakowski BP, Streeck CS, Wundrack SW, Weber AW, Brunken SB, Mainz RM, Beckhoff BB, Stosch RS
Keywords:

Calibration, Cu(In; Ga)Se2, International System of Units, Measurement uncertainty, Raman mapping, Raman spectrometry, SI, Solar cell, Traceability, X-ray spectrometry

Document type Article
Journal title / Source Applied Spectroscopy
Peer-reviewed article 1
Volume 70
Issue 2
Page numbers / Article number 279-288
Publisher's name SAGE Publications 
Publication date 2016-2
ISSN 0003-7028
DOI 10.1177/0003702815620131.
Web URL http://www.ncbi.nlm.nih.gov/pubmed/26903563
Language English

Back to the list view