Traceable quantitative Raman spectrometry and x-ray fluorescence analysis as non-destructive methods for spatially resolved chemical characterization of Cu(In,Ga)Se2 absorber films
Zakel SZ, Pollakowski BP, Streeck CS, Wundrack SW, Weber AW, Brunken SB, Mainz RM, Beckhoff BB, Stosch RSCalibration, Cu(In; Ga)Se2, International System of Units, Measurement uncertainty, Raman mapping, Raman spectrometry, SI, Solar cell, Traceability, X-ray spectrometry
| Document type | Article |
| Journal title / Source | Applied Spectroscopy |
| Peer-reviewed article | 1 |
| Volume | 70 |
| Issue | 2 |
| Page numbers / Article number | 279-288 |
| Publisher's name | SAGE Publications |
| Publication date | 2016-2 |
| ISSN | 0003-7028 |
| DOI | 10.1177/0003702815620131. |
| Web URL | http://www.ncbi.nlm.nih.gov/pubmed/26903563 |
| Language | English |