Traceable High Impedance Calibration Standards
Haase Martin, Hoffmann Karel, Hudlička MartinCalibration standards, characterization, electromagnetic simulation, microwave measurement, scattering parameters
Document type | Proceedings |
Journal title / Source | 87th ARFTG Microwave Measurement Conference (ARFTG) |
Peer-reviewed article | 1 |
Volume | n/a |
Issue | n/a |
Page numbers / Article number | 1-4 |
Publisher's name | IEEE |
Publisher's address (city only) | Piscataway |
Publication date | 2016-5-27 |
Conference name | 87th ARFTG Microwave Measurement Conference (ARFTG) |
Conference date | 27 May 2016 |
Conference place | San Francisco, CA, USA |
ISSN | n/a |
DOI | 10.1109/ARFTG.2016.7501942 |
ISBN | n/a |
Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7501942&isnumber=7501936 |
Language | English |