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Traceable High Impedance Calibration Standards

Haase Martin, Hoffmann Karel, Hudlička Martin
Keywords:

Calibration standards, characterization, electromagnetic simulation, microwave measurement, scattering parameters

Document type Proceedings
Journal title / Source 87th ARFTG Microwave Measurement Conference (ARFTG)
Peer-reviewed article 1
Volume n/a
Issue n/a
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2016-5-27
Conference name 87th ARFTG Microwave Measurement Conference (ARFTG)
Conference date 27 May 2016
Conference place San Francisco, CA, USA
ISSN n/a
DOI 10.1109/ARFTG.2016.7501942
ISBN n/a
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7501942&isnumber=7501936
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)