Traceable High Impedance Calibration Standards
Haase Martin, Hoffmann Karel, Hudlička MartinCalibration standards, characterization, electromagnetic simulation, microwave measurement, scattering parameters
| Document type | Proceedings |
| Journal title / Source | 87th ARFTG Microwave Measurement Conference (ARFTG) |
| Peer-reviewed article | 1 |
| Volume | n/a |
| Issue | n/a |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2016-5-27 |
| Conference name | 87th ARFTG Microwave Measurement Conference (ARFTG) |
| Conference date | 27 May 2016 |
| Conference place | San Francisco, CA, USA |
| ISSN | n/a |
| DOI | 10.1109/ARFTG.2016.7501942 |
| ISBN | n/a |
| Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7501942&isnumber=7501936 |
| Language | English |