Traceable Calibration with 1.0mm Coaxial Standards
Hoffmann J, Wollensack M, Ruefenacht J, Stalder D, Zeier MCoaxial, S-parameters, transmission, reflection, vector network analyzer
| Document type | Proceedings |
| Journal title / Source | 2016 87th ARFTG Microwave Measurement Conference (ARFTG) |
| Peer-reviewed article | 1 |
| Volume | May 2016 |
| Issue | 1 |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publisher's address (city only) | New York |
| Publication date | 2016-5 |
| Conference name | 87th ARFTG Microwave Measurement Conference |
| Conference date | 27.5.2016 |
| Conference place | San Francisco |
| ISSN | n/a |
| DOI | 10.1109/ARFTG.2016.7501943 |
| ISBN | n/a |
| Web URL | http://ieeexplore.ieee.org/document/7501943/ |
| Language | English |