Traceable Calibration with 1.0mm Coaxial Standards
Hoffmann J, Wollensack M, Ruefenacht J, Stalder D, Zeier MCoaxial, S-parameters, transmission, reflection, vector network analyzer
Document type | Proceedings |
Journal title / Source | 2016 87th ARFTG Microwave Measurement Conference (ARFTG) |
Peer-reviewed article | 1 |
Volume | May 2016 |
Issue | 1 |
Page numbers / Article number | 1-4 |
Publisher's name | IEEE |
Publisher's address (city only) | New York |
Publication date | 2016-5 |
Conference name | 87th ARFTG Microwave Measurement Conference |
Conference date | 27.5.2016 |
Conference place | San Francisco |
ISSN | n/a |
DOI | 10.1109/ARFTG.2016.7501943 |
ISBN | n/a |
Web URL | http://ieeexplore.ieee.org/document/7501943/ |
Language | English |