Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements

Weiss T.P., Bissig B., Feurer T., Carron R., Buecheler S., Tiwari A.N.

thin filmsemiconductor

Document type Article
Journal title / Source Scientific Reports
Volume 9
Issue 1
Publisher's name Springer Nature
Publication date 2019-3-29
ISSN 2045-2322
DOI 10.1038/s41598-019-41716-x
Language English

Back to the list view