Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements
Weiss T.P., Bissig B., Feurer T., Carron R., Buecheler S., Tiwari A.N.thin filmsemiconductor
| Document type | Article |
| Journal title / Source | Scientific Reports |
| Volume | 9 |
| Issue | 1 |
| Publisher's name | Springer Nature |
| Publication date | 2019-3-29 |
| ISSN | 2045-2322 |
| DOI | 10.1038/s41598-019-41716-x |
| Language | English |