The Effect of Bilayer Regions on the Response of Epitaxial Graphene Devices to Environmental Gating

Hill-Pearce R. E., Eless V, Lartsev A, Martin N. A., Barker-Snook I. L., Helmore J. J., Yakimova R., Gallop J. C., Hao L

grapheme, metrology, scanning Kelvin probe microscopy

Document type Article
Journal title / Source Carbon
Peer-reviewed article 1
Volume 93
Issue n/a
Page numbers / Article number 896–902
Publisher's name Elsevier
Publisher's address (city only) Amsterdam
Publication date 2015-5-23
ISSN n/a
DOI 10.1016/j.carbon.2015.05.061
Language English

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