Testing the new generation of low-frequency current comparators
Satrapinski A., Götz M., Pesel E., Fletcher N., Gournay P., Rolland B.Resistance measurement, CCC, current comparator, low frequency, measurement uncertainty, sensitivity
| Document type | Proceedings |
| Journal title / Source | Digest on Conference on Precision Electromagnetic Measurements (CPEM2016) |
| Peer-reviewed article | 1 |
| Publisher's name | IEEE |
| Publication date | 2016-8-11 |
| Conference name | CPEM 2016 |
| Conference date | 10-07-2016 to 15-07-2016 |
| Conference place | Ottawa, Canada |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM.2016.7540594 |
| ISBN | 978-1-4673-9134-4 |
| Web URL | http://ieeexplore.ieee.org/document/7540594/?denied |
| Language | English |