Testing the new generation of low-frequency current comparators

Satrapinski A., Götz M., Pesel E., Fletcher N., Gournay P., Rolland B.

Resistance measurement, CCC, current comparator, low frequency, measurement uncertainty, sensitivity

Document type Proceedings
Journal title / Source Digest on Conference on Precision Electromagnetic Measurements (CPEM2016)
Peer-reviewed article 1
Publisher's name IEEE
Publication date 2016-8-11
Conference name CPEM 2016
Conference date 10-07-2016 to 15-07-2016
Conference place Ottawa, Canada
ISSN 2160-0171
DOI 10.1109/CPEM.2016.7540594
ISBN 978-1-4673-9134-4
Web URL http://ieeexplore.ieee.org/document/7540594/?denied
Language English

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