Temperature stability of SNIS Josephson arrays between 4.2 K and critical temperature in cryocooler
Sosso A., Trinchera B., Monitcone E., Fretto M., Durandetto P., Lacquaniti V.Josephson Junctions, Voltage standards, Cryocoolers, Temperature effects, Metrology
| Document type | Article |
| Journal title / Source | IEEE Transactions on Superconductivity |
| Peer-reviewed article | 1 |
| Volume | 25 |
| Issue | 3 |
| Page numbers / Article number | 1101404 (4 pages) |
| Publisher's name | IEEE |
| Publisher's address (city only) | New York |
| Publication date | 2014 |
| ISSN | 1051-8223 |
| DOI | 10.1109/TASC.2014.2383173 |
| Web URL | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6990584&tag=1 |
| Language | English |