Temperature stability of SNIS Josephson arrays between 4.2 K and critical temperature in cryocooler
Sosso A., Trinchera B., Monitcone E., Fretto M., Durandetto P., Lacquaniti V.Josephson Junctions, Voltage standards, Cryocoolers, Temperature effects, Metrology
Document type | Article |
Journal title / Source | IEEE Transactions on Superconductivity |
Peer-reviewed article | 1 |
Volume | 25 |
Issue | 3 |
Page numbers / Article number | 1101404 (4 pages) |
Publisher's name | IEEE |
Publisher's address (city only) | New York |
Publication date | 2014 |
ISSN | 1051-8223 |
DOI | 10.1109/TASC.2014.2383173 |
Web URL | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6990584&tag=1 |
Language | English |