Surface mapping of field induced piezoelectric strain at elevated temperatures employing full-field interferometry

Stevenson TS, Quast TQ, Bartl GB, Schmitz-Kempen TSK, Weaver PMW
Document type Article
Journal title / Source IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Peer-reviewed article 1
Volume 62
Issue 1
Page numbers / Article number 88-96
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2015-1
ISSN 0885-3010
DOI 10.1109/TUFFC.2014.006683
Web URL http://ieeexplore.ieee.org/document/7002928/?arnumber=7002928
Language English

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