Exploring Conductance Quantization Effects in Electroformed Filaments for Their Potential Application to a Resistance Standard
Suñé J., Aguirre F., Bargalló González M., Campabadal F., Miranda E.conductance quantization, dielectric breakdown, metrology, resistance standard
| Document type | Article |
| Journal title / Source | Advanced Quantum Technologies |
| Publisher's name | Wiley |
| Publisher's address (city only) | Hoboken, NJ, United States |
| Publication date | 2023-5-18 |
| ISSN | 2511-9044, 2511-9044 |
| DOI | 10.1002/qute.202300048 |
| Language | English |