Exploring Conductance Quantization Effects in Electroformed Filaments for Their Potential Application to a Resistance Standard

Suñé J., Aguirre F., Bargalló González M., Campabadal F., Miranda E.
Keywords:

conductance quantization, dielectric breakdown, metrology, resistance standard

Document type Article
Journal title / Source Advanced Quantum Technologies
Publisher's name Wiley
Publisher's address (city only) Hoboken, NJ, United States
Publication date 2023-5-18
ISSN 2511-9044, 2511-9044
DOI 10.1002/qute.202300048
Language English

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