Use of a nanocrystalline core for a precise non-invasive AC current measurement
Styblikova R., Knenicky M, Hlavacek J., Prochazka R., Draxler K.AC current sensor, nanocrystalline material, non-invasive measurement, phase displacement, ratio error.
| Document type | Proceedings |
| Journal title / Source | 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) |
| Publisher's name | IEEE |
| Publication date | 2016-7 |
| Conference name | 2016 Conference on Precision Electromagnetic Measurements |
| Conference date | 10-07-2016 to 15-07-2016 |
| Conference place | Ottawa, ON, Canada |
| ISSN | 2160-0171 |
| DOI | 10.1109/CPEM.2016.7540492 |
| ISBN | 978-1-4673-9134-4 |
| Language | English |