Stability tests of electronic calibration units
Zeier M, Hoffmann J, Huerlimann P, Ruefenacht J, Wollensack M, Judaschke R, Kuhlmann KMeasurement technique, calibration, stability analysis, temperature dependence, scattering parameters, network analysis, electronic calibration
| Document type | Proceedings |
| Journal title / Source | CPEM 2014 Digest |
| Peer-reviewed article | 1 |
| Volume | 2014 |
| Issue | 2014 |
| Page numbers / Article number | 16-17 |
| Publisher's name | IEEE |
| Publisher's address (city only) | n/a |
| Publication date | 2014 |
| Conference name | Conference on Precision Electromagnetic Measurements |
| Conference date | 25-08-2014 to 29-08-2014 |
| Conference place | Rio de Janeiro, Brazil |
| ISSN | 0589-1485 |
| DOI | 10.1109/CPEM.2014.6898236 |
| ISBN | 978-1-4799-5205-2 |
| Language | English |