Millimeter-Wave on-Wafer TRL Calibration employing 3D EM Simulation-Based Characteristic Impedance Extraction
Galatro Luca, Spirito MarcoCalibration, characteristic impedance, measurement, millimeter wave, silicon, TRL, vector network analyzer (VNA)
| Document type | Article |
| Journal title / Source | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 65 |
| Issue | 4 |
| Page numbers / Article number | 9 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2017-4 |
| ISSN | 0018-9480 |
| DOI | 10.1109/TMTT.2016.2609413 |
| Web URL | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7837598 |
| Language | English |