Spatially resolved electrical characterisation of graphene layers by an evanescent field microwave microscope
Gregory A, Hao L, Klein N, Gallop J, Mattevi C, Shaforost O, Lees K, Clarke Bevanescent field microwave microscope, traceable measurements, graphene
| Document type | Article |
| Journal title / Source | Physica E: Low dimensional systems and nanostructures |
| Peer-reviewed article | 1 |
| Volume | 56 |
| Issue | n/a |
| Page numbers / Article number | 431 - 434 |
| Publisher's name | Elsevier |
| Publisher's address (city only) | Amsterdam |
| Publication date | 2014-2-1 |
| ISSN | n/a |
| DOI | 10.1016/j.physe.2012.10.006 |
| Web URL | http://www.sciencedirect.com/science/article/pii/S1386947712004018 |
| Language | English |