Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA
Singh D., Salter M.J., Johny S., Ridler N.M.measurement uncertainty, VNA, large-signal measurements, RF amplifier
| Document type | Article |
| Journal title / Source | IEEE Instrumentation & Measurement Magazine |
| Volume | 25 |
| Issue | 6 |
| Page numbers / Article number | 37-44 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway, NJ, USA |
| Publication date | 2022-8 |
| ISSN | 1094-6969 |
| DOI | 10.5281/zenodo.10683173 |
| Web URL | https://ieeexplore.ieee.org/document/9847190 |
| Language | English |