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Uncertainty Analysis in the Measurement of Switching Losses in GaN FETs Power Converters

Silva F., Pous M., Azpurua M.A.
Keywords:

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Document type Proceedings
Journal title / Source 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Volume 2020
Issue -
Page numbers / Article number 1-6
Publisher's name IEEE
Publication date 2020-5
Conference name 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Conference date 25-05-2020 to 28-05-2020
Conference place Dubrovnik, Croatia
ISSN Electronic ISSN: 2642-2077
ISBN Electronic ISBN: 978-1-7281-44
Web URL https://ieeexplore.ieee.org/document/9129552
Language English
Persistent Identifier http://hdl.handle.net/2117/328678

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Information

Project title (JRP)
16ENG06: ADVENT: Metrology for advanced energy-saving technology in next-generation electronics applications
Name of Call / Funding Programme
EMPIR 2016: Energy