SI-Traceable High-Accuracy EDM based on Multi-Wavelength Interferometry
Pollinger F., Mildner J., Köchert P., Yang R., Bosnjakovic A., Meyer T., Wedde M., Meiners-Hagen K.EDM, multi-wavelength interferometry, index of refraction, EMRP JRP SIB60 Surveying
| Document type | Proceedings |
| Journal title / Source | Proceedings of the third Joint International Symposium on Deformation Monitoring |
| Page numbers / Article number | Submission 15 |
| Publication date | 2016-4 |
| Conference name | Joint International Symposium on Deformation Monitoring |
| Conference date | 30-03-2016 to 01-04-2016 |
| Conference place | Vienna, Austria |
| Web URL | http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf |
| Language | English |
| Persistent Identifier | http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf |