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SI-Traceable High-Accuracy EDM based on Multi-Wavelength Interferometry

Pollinger F., Mildner J., Köchert P., Yang R., Bosnjakovic A., Meyer T., Wedde M., Meiners-Hagen K.
Keywords:

EDM, multi-wavelength interferometry, index of refraction, EMRP JRP SIB60 Surveying

Document type Proceedings
Journal title / Source Proceedings of the third Joint International Symposium on Deformation Monitoring
Page numbers / Article number Submission 15
Publication date 2016-4
Conference name Joint International Symposium on Deformation Monitoring
Conference date 30-03-2016 to 01-04-2016
Conference place Vienna, Austria
Web URL http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf
Language English
Persistent Identifier http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf

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Information

Project title (JRP)
SIB60: Surveying: Metrology for long distance surveying
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)