SI-Traceable High-Accuracy EDM based on Multi-Wavelength Interferometry
Pollinger F., Mildner J., Köchert P., Yang R., Bosnjakovic A., Meyer T., Wedde M., Meiners-Hagen K.EDM, multi-wavelength interferometry, index of refraction, EMRP JRP SIB60 Surveying
Document type | Proceedings |
Journal title / Source | Proceedings of the third Joint International Symposium on Deformation Monitoring |
Page numbers / Article number | Submission 15 |
Publication date | 2016-4 |
Conference name | Joint International Symposium on Deformation Monitoring |
Conference date | 30-03-2016 to 01-04-2016 |
Conference place | Vienna, Austria |
Web URL | http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf |
Language | English |
Persistent Identifier | http://www.fig.net/resources/proceedings/2016/2016_03_jisdm_pdf/nonreviewed/JISDM_2016_submission_15.pdf |