Impedance Standard Substrate Characterization and EM model definition for Cryogenic and Quantum-Computing Applications
Shokrolahzade E., Sebastiano F., Mubarak F., Babaie M., Spirito M.ISS, Calibration, Cryogenic, SOLR, Quantum Metrology
| Document type | Proceedings |
| Journal title / Source | mpedance Standard Substrate Characterization and EM model definition for Cryogenic and Quantum-Computing Applications |
| Publication date | 2023-7-28 |
| Conference name | 2023 IEEE/MTT-S International Microwave Symposium |
| Conference date | 11-06-2023 to 16-06-2023 |
| Conference place | San Diego, CA, USA |
| DOI | 10.1109/IMS37964.2023.10188097 |
| Web URL | https://repository.tudelft.nl/record/uuid:32d1d68a-57ad-4585-993c-0e9776b0ecdd |
| Language | English |