Characterisation of Dielectric Substrates at Millimetre-wave and Sub-terahertz Frequencies Using a VNA-based Guided-wave Technique
Shang X., Ridler N., Skinner J., Stokes D., Ausden L.dielectric measurement, permittivity, loss tangent, MCK, millimetre-wave and terahertz measurement
| Document type | Proceedings |
| Journal title / Source | 2024 54th European Microwave Conference (EuMC) |
| Page numbers / Article number | 640-643 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2024-10-31 |
| Conference name | 2024 54th European Microwave Conference |
| Conference date | 24-09-2024 to 26-09-2024 |
| Conference place | Paris, France |
| DOI | 10.5281/zenodo.15062804 |
| ISBN | 978-2-87487-077-4 |
| Web URL | https://ieeexplore.ieee.org/abstract/document/10732359 |
| Language | English |