Introductory guide to making Planar S-parameter measurements at millimetre-wave frequencies
Shang X., Ridler N.M., Ding J., Geen M.Calibration, on-wafer measurement, planar measurement, S-parameters, millimetre-wave, probes, traceability, vector network analyzer (VNA)
| Document type | Good Practice Guide |
| Journal title / Source | |
| Publisher's name | National Physical Laboratory |
| Publication date | 2021-1-13 |
| DOI | 10.47120/npl.9001 |
| Language | English |