Dielectric Measurements of Conventional and 3-D Printed Substrate Materials from 50 GHz to 1.5 THz Using Free-Space and TDS Methods
Shang X., Ausden L., Naftaly M., Ridler N., Feng D., Navarro-Cia M., Hales J., Premerlani R.Dielectric measurement, free-space method, material characterization, millimeter-wave and THz, substrate materials, TDS
| Document type | Proceedings |
| Journal title / Source | |
| Page numbers / Article number | 717-720 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2025-1-1 |
| Conference name | 2025 IEEE/MTT-S International Microwave Symposium |
| Conference date | 15-20 June 2025 |
| Conference place | San Francisco, CA, USA |
| DOI | 10.5281/zenodo.17429041 |