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Improved Just-Before-Test Verification Methods with VNA for Conducted EMC Tests

Şen, O. and Çakır, S.
Keywords:

Conducted Emission, Conducted Immunity, EMC, Verification

Document typeProceeding
Journal title / Source2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)
Page numbers / Article number1-6
Publisher's nameIEEE
Publisher's address (city only)Piscataway, USA
Publication date 2018-08-30
Conference name2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)
Conference date27-08-2018 to 30-08-2018
Conference placeAmsterdam, The Netherlands
ISSN2325-0364
DOI10.1109/EMCEurope.2018.8485179
ISBN978-1-4673-9698-1
Web URLhttp://rfmw.cmi.cz/documents/papers/Sen_EMCEurope2018OA.pdf
LanguageEnglish

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