On-Site EMC Testing and Interference Prevention
Schrader T., Münter K., Jastrow C., Daneschnejad A., Kleine-Ostmann T.Document type | Proceedings |
Journal title / Source | Proceedings of the International Symposium on Electromagnetic Compatibility |
Page numbers / Article number | 166-170 |
Publication date | 2009 |
Conference name | International Symposium on Electromagnetic Compatibility |
Conference date | 17 - 21 August 2009 |
Conference place | Austin, Tex., USA |
Web URL | http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5284583 |