Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation
Schmid D., Eisermann R., Peczek A., Winzer G., Zimmermann L., Krenek S.integrated photonics, ring resonator, microring, refractive index sensor, integrated circuit design, coupling, loss, critical coupling, wafer mapping, photonic yield
| Document type | Article |
| Journal title / Source | Photonics |
| Volume | 12 |
| Issue | 3 |
| Page numbers / Article number | 234 |
| Publisher's name | MDPI AG |
| Publisher's address (city only) | Basel, Switzerland |
| Publication date | 2025-3 |
| ISSN | 2304-6732 |
| DOI | 10.3390/photonics12030234 |
| Web URL | https://www.mdpi.com/2304-6732/12/3/234 |
| Language | English |