On-Wafer Residual Error Correction Through Adaptive Filtering of Verification Line Measurements
Savin A., Arz U.uncertainty,calibration,standards,measurement uncertainty,coplanar waveguides,scattering, parameters,microwave measurement
Document type | Proceedings |
Journal title / Source | 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi) |
Page numbers / Article number | 79-80 |
Publisher's name | IEEE |
Publication date | 2019-1-14 |
Conference name | 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi) |
Conference date | 21-11-2018 to 24-11-2018 |
Conference place | Stellenbosch, South Africa |
DOI | 10.7795/EMPIR.14IND02.CA.20190403F |
ISBN | 978-1-5386-7845-9 |
Web URL | https://doi.org/10.1109/CEMI.2018.8610566 |
Language | English |