On-Wafer Residual Error Correction Through Adaptive Filtering of Verification Line Measurements
Savin A., Arz U.uncertainty,calibration,standards,measurement uncertainty,coplanar waveguides,scattering, parameters,microwave measurement
| Document type | Proceedings |
| Journal title / Source | 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi) |
| Page numbers / Article number | 79-80 |
| Publisher's name | IEEE |
| Publication date | 2019-1-14 |
| Conference name | 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi) |
| Conference date | 21-11-2018 to 24-11-2018 |
| Conference place | Stellenbosch, South Africa |
| DOI | 10.7795/EMPIR.14IND02.CA.20190403F |
| ISBN | 978-1-5386-7845-9 |
| Web URL | https://doi.org/10.1109/CEMI.2018.8610566 |
| Language | English |