A novel traceability route to the SI in roughness measurements at IPQ

Saraiva F., Neves P., Pires C., Sousa J.A.
Keywords:

metrological traceability, surface texture, stylus instrument, roughness, displacement

Document type Article
Journal title / Source Acta IMEKO
Volume 12
Issue 3
Page numbers / Article number 1-5
Publisher's name IMEKO International Measurement Confederation
Publisher's address (city only) Budapest, Hungary
Publication date 2023-9
ISSN 2221-870X, 0237-028X
DOI 10.21014/actaimeko.v12i3.1456
Language English

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