Metrology for new industrial measurement technologies
Santel F., Franke M., Härtig F., Kniel K., Wendt K.| Document type | Proceedings |
| Journal title / Source | Proceedings 14th International Metrology Congress |
| Publication date | 2009 |
| Conference name | 14th International Metrology Congress |
| Conference date | 22 - 25 June 2009 |
| Conference place | Paris, France |