Metrology for new industrial measurement technologies
Santel F., Franke M., Härtig F., Kniel K., Wendt K.Document type | Proceedings |
Journal title / Source | Proceedings 14th International Metrology Congress |
Publication date | 2009 |
Conference name | 14th International Metrology Congress |
Conference date | 22 - 25 June 2009 |
Conference place | Paris, France |