Bringing real-time traceability to high-speed atomic force microscopy

Heaps E., Yacoot A., Dongmo H., Picco L., Payton O.D., Russell-Pavier F.S, Korpelainen V., Klapetek P

Metrology, high-speed atomic force microscopy, traceability, nanometrology, nanotechnology

Document type Article
Journal title / Source Measurement Science and Technology
Publisher's name IOP Publishing
Publication date 2020-3
ISSN 0957-0233, 1361-6501
DOI 10.1088/1361-6501/ab7ca9
Language English

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