Workflow towards automated segmentation of agglomerated, non-spherical particles from electron microscopy images using artificial neural networks

Rühle B., Krumrey J.F., Hodoroaba V-D.

Artificial intelligence;Automated image analysis;Electron microscopy;Image segmentation;Neural networks

Document type Article
Journal title / Source Scientific Reports
Volume 11
Issue 1
Page numbers / Article number 10
Publisher's name Springer Science and Business Media LLC
Publication date 2021-3
ISSN 2045-2322
DOI 10.1038/s41598-021-84287-6
Language English

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