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Investigating the kinetics of layer development during the color etching of low-carbon steel with in-situ spectroscopic ellipsometry

Romanenko A., Bíró T., Szabó P.J., Petrik P., Bonyár A., József R.
Keywords:

color etching, ellipsometry, in situ characterization

Document type Article
Journal title / Source Heliyon
Volume 10
Issue 3
Page numbers / Article number e25271
Publisher's name Elsevier BV
Publisher's address (city only) Amsterdam, NX, Netherlands
Publication date 2024-2
ISSN 2405-8440
DOI 10.1016/j.heliyon.2024.e25271
Language English

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Information

Name of Call / Funding Programme
EMPIR 2020: Fundamental