Variability in Resistive Memories
Roldán J.B., Picos R., Jiménez-Molinos F., Stavrinides S.G., Salvador E., Alonso F.J., Campabadal F., Spagnolo B., Lanza M., Saludes-Tapia M., Poblador S., Miranda E., Maldonado D., Mikhaylov A.N., Agudov N.V., Dubkov A.A., Koryazhkina M.N., González M.B., Villena M.A., Chua L.O.2D materials, experimental characterization, memristor, modeling,resistive memory, resistive switching, variability
| Document type | Article |
| Journal title / Source | Advanced Intelligent Systems |
| Page numbers / Article number | 2200338 |
| Publisher's name | Wiley |
| Publisher's address (city only) | Hoboken, NJ, United States |
| Publication date | 2023-3-14 |
| ISSN | 2640-4567, 2640-4567 |
| DOI | 10.1002/aisy.202200338 |
| Web URL | https://onlinelibrary.wiley.com/doi/epdf/10.1002/aisy.202200338 |
| Language | English |