The EMRP project Metrology for III–V materials based high efficiency multi-junction solar cells
Rodriguez T. G., Pollakowski B., Lackner D., Krupka J., Kienberger F., Kern R., Hoffmann J., Gambacorti N., Cuenat A., Baumgartner H., Almuneau G., Bounouh A., Sametoglu F., Usydus L., Winter S., Witt F.Nanoscale electrical measurement Multijunction solar cells standards high conversion efficiency III-V materials characterization
Document type | Proceedings |
Journal title / Source | 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) |
Publisher's name | IEEE |
Publication date | 2014-8 |
Conference name | Conference on Precision Electromagnetic Measurements |
Conference date | 25-08-2014 to 29-08-2014 |
Conference place | Rio de Janeiro |
ISSN | no ISSN |
DOI | 10.1109/CPEM.2014.6898387 |
ISBN | 978-1-4799-2478-3 |
Language | English |