The EMRP project Metrology for III–V materials based high efficiency multi-junction solar cells

Rodriguez T. G., Pollakowski B., Lackner D., Krupka J., Kienberger F., Kern R., Hoffmann J., Gambacorti N., Cuenat A., Baumgartner H., Almuneau G., Bounouh A., Sametoglu F., Usydus L., Winter S., Witt F.
Keywords:

Nanoscale electrical measurement Multijunction solar cells standards high conversion efficiency III-V materials characterization

Document type Proceedings
Journal title / Source 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
Publisher's name IEEE
Publication date 2014-8
Conference name Conference on Precision Electromagnetic Measurements
Conference date 25-08-2014 to 29-08-2014
Conference place Rio de Janeiro
ISSN no ISSN
DOI 10.1109/CPEM.2014.6898387
ISBN 978-1-4799-2478-3
Language English

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