Temperature Humidity Bias Testing of a Wafer-Embedded Coplanar Waveguide Line up to 40 GHz
Robador A., Skinner J., Manning L.Temperature Humidity Bias Testing, S-parameters, Surface Insulation Resistance On-Wafer, Environmental Testing.
| Document type | Proceedings |
| Journal title / Source | 2024 103rd ARFTG Microwave Measurement Conference Proceedings |
| Publication date | 2024-9 |
| Conference name | 2024 103rd ARFTG Microwave Measurement Conference |
| Conference date | 21-06-2024 to 21-06-2024 |
| Conference place | Washington, DC, USA |
| DOI | 10.5281/zenodo.13850634 |
| Language | English |