A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model

Liu C., Wu A., Li C., Ridler N.

Calibration, Crosstalk, Standards, Probes, Semiconductor device measurement, Measurement uncertainty, Numerical models, approximation theory, calibration, measurement errors, measurement standards, millimetre wave measurement, network analysers, S-parameters

Document type Article
Journal title / Source IEEE Transactions on Microwave Theory and Techniques
Volume 66
Issue 8
Page numbers / Article number 3894-3900
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2018-8
ISSN 0018-9480, 1557-9670
DOI 10.1109/TMTT.2018.2832052
Language English

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