An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies
Clarke R G, Li C, Ridler N MMeasurement repeatability, Measurement reproducibility, On-wafer measurements, Millimeter-wave measurements, Measurement uncertainty
| Document type | Proceedings |
| Journal title / Source | 2017 90th ARFTG Microwave Measurement Symposium (ARFTG) |
| Publisher's name | IEEE |
| Publisher's address (city only) | 445 Hoes Lane Piscataway NJ 08855-1331 United States |
| Publication date | 2017-11-30 |
| Conference name | ARFTG 90th Microwave Measurement Conference |
| Conference date | 28-11-2017 to 01-12-2017 |
| Conference place | Boulder, Colorado |
| DOI | 10.1109/arftg.2017.8255866 |
| ISBN | 978-1-5386-4356-3 |
| Web URL | http://eprints.whiterose.ac.uk/125336/ |
| Language | English |