An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies

Clarke R G, Li C, Ridler N M

Measurement repeatability, Measurement reproducibility, On-wafer measurements, Millimeter-wave measurements, Measurement uncertainty

Document type Proceedings
Journal title / Source 2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
Publisher's name IEEE
Publisher's address (city only) 445 Hoes Lane Piscataway NJ 08855-1331 United States
Publication date 2017-11-30
Conference name ARFTG 90th Microwave Measurement Conference
Conference date 28-11-2017 to 01-12-2017
Conference place Boulder, Colorado
DOI 10.1109/arftg.2017.8255866
ISBN 978-1-5386-4356-3
Language English

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