A numerical analysis of the short open load calibration robustness for capacitance measurements in Scanning Microwave Microscopy
Richert D., Deleruyelle D., Moran-Meza J., Kaja K., Imanaliev A., Hoffmann J., Gautier B., Piquemal F.scanning microwave microscopy, finite element analysis, tip apex geometry, self-calibration, Maxwell equation
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Volume | 36 |
| Page numbers / Article number | 1-9 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2024-10-18 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/ad7e3b |
| Language | English |