Residual Error Analysis of a Calibrated Vector Network Analyzer

Mubarak F.A., Rietveld G.
Keywords:

S-parameter, VNA, VNA calibration, VNA verification, airline, ripple technique, residual error, assessment technique.

Document type Proceedings
Journal title / Source Microwave Measurement Conference (ARFTG)
Peer-reviewed article 1
Volume n/a
Issue 84th ARFTG proceedings
Page numbers / Article number 1-6
Publisher's name IEEE
Publisher's address (city only) n/a
Publication date 2014-12-4
ISSN n/a
DOI 10.1109/ARFTG.2014.7013417
Language English

Back to the list view