Rapid determination of the photometric bidirectional scatter distribution function by use of a near field goniophotometer

Leloup F.B., De Ketelaere W., Audenaert J., Hanselaer P.

bidirectional reflectance distribution function, near-field goniophotometry, optical metrology, material appearance characterization

Document type Proceedings
Journal title / Source PROCEEDINGS OF SPIE VOLUME 9018: Measuring, Modeling, and Reproducing Material Appearance
Peer-reviewed article 1
Volume 9018
Issue NA
Page numbers / Article number 8 pages / Article no. 901803
Publisher's name SPIE
Publisher's address (city only) Bellingham
Publication date 2014-2-24
Conference name Measuring, Modeling, and Reproducing Material Appearance
Conference date 2 February 2014
Conference place San Francisco
DOI 10.1117/12.2035958
Web URL http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1835519
Language English

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