Rapid determination of the photometric bidirectional scatter distribution function by use of a near field goniophotometer
Leloup F.B., De Ketelaere W., Audenaert J., Hanselaer P.bidirectional reflectance distribution function, near-field goniophotometry, optical metrology, material appearance characterization
| Document type | Proceedings |
| Journal title / Source | PROCEEDINGS OF SPIE VOLUME 9018: Measuring, Modeling, and Reproducing Material Appearance |
| Peer-reviewed article | 1 |
| Volume | 9018 |
| Issue | NA |
| Page numbers / Article number | 8 pages / Article no. 901803 |
| Publisher's name | SPIE |
| Publisher's address (city only) | Bellingham |
| Publication date | 2014-2-24 |
| Conference name | Measuring, Modeling, and Reproducing Material Appearance |
| Conference date | 2 February 2014 |
| Conference place | San Francisco |
| ISSN | NA |
| DOI | 10.1117/12.2035958 |
| ISBN | NA |
| Web URL | http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1835519 |
| Language | English |