Four-Point Measurement Setup for Correlative Microscopy of Nanowires
Pruchnik BC., Piasecki T., Sulka G., Usydus Ł., Piejko A., Pruchnik J., Kwoka K., Gacka E., Fidelus J.D., Gotszalk T.P.electrical measurements, four-point measurement, nanowires, nanowire resistance measurement, nanomanipulation, AFM, ZnO
| Document type | Article |
| Journal title / Source | Nanomaterials |
| Volume | 13 |
| Issue | 17 |
| Page numbers / Article number | 2451 |
| Publisher's name | MDPI AG |
| Publisher's address (city only) | Basel, Switzerland |
| Publication date | 2023-8-30 |
| ISSN | 2079-4991 |
| DOI | 10.3390/nano13172451 |
| Web URL | https://www.mdpi.com/2079-4991/13/17/2451 |
| Language | English |