Four-Point Measurement Setup for Correlative Microscopy of Nanowires

Pruchnik BC., Piasecki T., Sulka G., Usydus Ł., Piejko A., Pruchnik J., Kwoka K., Gacka E., Fidelus J.D., Gotszalk T.P.
Keywords:

electrical measurements, four-point measurement, nanowires, nanowire resistance measurement, nanomanipulation, AFM, ZnO

Document type Article
Journal title / Source Nanomaterials
Volume 13
Issue 17
Page numbers / Article number 2451
Publisher's name MDPI AG
Publisher's address (city only) Basel, Switzerland
Publication date 2023-8-30
ISSN 2079-4991
DOI 10.3390/nano13172451
Web URL https://www.mdpi.com/2079-4991/13/17/2451
Language English

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