Profile estimation for Pt submicron wire on rough Si substrate from experimental data
Karamehmedović M., Hansen P.-E., Dirscherl K., Karamehmedović E., Wriedt T.| Document type | Article |
| Journal title / Source | OPTICS EXPRESS |
| Peer-reviewed article | 1 |
| Volume | 20 |
| Issue | 19 |
| Page numbers / Article number | 21678 - 21686 |
| Publication date | 2012-9-6 |
| DOI | 10.1364/OE.20.021678 |
| Language | English |