Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band
Phung G.N., Schmuckle F.J., Doerner R. , Heinrich W., Probst T., Arz U.on-wafer probes, coplanar waveguides (CPW), substrate modes, calibration
| Document type | Proceedings |
| Journal title / Source | 2018 48th European Microwave Conference (EuMC) |
| Publisher's name | IEEE |
| Publication date | 2018-9 |
| Conference name | 2018 48th European Microwave Conference |
| Conference date | 23-09-2018 to 28-09-2018 |
| Conference place | Madrid |
| DOI | 10.23919/EuMC.2018.8541813 |
| Web URL | https://www.fbh-berlin.com/publications-patents/publications/title/impact-of-substrate-modes-on-mtrl-calibrated-cpw-measurements-in-g-band |
| Language | English |