Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band

Phung G.N., Schmuckle F.J., Doerner R. , Heinrich W., Probst T., Arz U.

on-wafer probes, coplanar waveguides (CPW), substrate modes, calibration

Document type Proceedings
Journal title / Source 2018 48th European Microwave Conference (EuMC)
Publisher's name IEEE
Publication date 2018-9
Conference name 2018 48th European Microwave Conference
Conference date 23-09-2018 to 28-09-2018
Conference place Madrid
DOI 10.23919/EuMC.2018.8541813
Language English

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